Foster, Adam S.
Scanning probe microscopy : atomic scale engineering by forces and currents. by Adam S. Foster;Werner A. Hofer - 1st ed. - New York : Springer Science. 2006. - xiv, 281 p. : ill. ; 25 cm.
Includes bibliographies.
9780387400907 0387400907
Scanning probe microscopy.
623.815 / FOS/2006
Scanning probe microscopy : atomic scale engineering by forces and currents. by Adam S. Foster;Werner A. Hofer - 1st ed. - New York : Springer Science. 2006. - xiv, 281 p. : ill. ; 25 cm.
Includes bibliographies.
9780387400907 0387400907
Scanning probe microscopy.
623.815 / FOS/2006