Chakradhar, Srimat T.

Neural models and algorithms for digital testing - 1st ed. - Boston Kluwer Academic Publishers 1991 - xii, 184 p. ill. 25 cm. - The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing .

Includes bibliographies

0792391659


Logic circuits

623.95 / CHA/1991