Leblebici, Yusuf

Hot-carrier reliability of MOS VLSI circuits - 1st ed. - London Kluwer Academic 1993 - xvi, 212p. ill. - The Kluwer international series in engineering and computer science ; VLSI, computer architecture, and digital signal processing .

Includes bibliographies

079239352X


Integrated circuits - VLSI

623.95 / LEB/1993