Snyder, Robert L.
Defect and microstructure analysis by diffraction - 1st ed. - Oxford Oxford University Press 1999 - xxii, 785 p. - International union of crystallography book series .
Includes bibliographies
0198501897
X-ray crystallography
548.83 / SNY/1999
Defect and microstructure analysis by diffraction - 1st ed. - Oxford Oxford University Press 1999 - xxii, 785 p. - International union of crystallography book series .
Includes bibliographies
0198501897
X-ray crystallography
548.83 / SNY/1999