Stenzel, Olaf
Optical characterization of thin solid films - 1st ed. - Cham Springer International Publishing 2018 - xxiv, 462 p. - Springer series in surface sciences .
Includes bibliographies
9783319753249
Spectrum analysis
543.0858 / STE/2018
Optical characterization of thin solid films - 1st ed. - Cham Springer International Publishing 2018 - xxiv, 462 p. - Springer series in surface sciences .
Includes bibliographies
9783319753249
Spectrum analysis
543.0858 / STE/2018