000 -LEADER |
fixed length control field |
00592nam a22001937a 4500 |
001 - CONTROL NUMBER |
control field |
16583 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
BD-DhUET |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
150321b xxu||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE |
Transcribing agency |
0 |
Modifying agency |
BD-DhUET |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
548.84 |
Item number |
BER/1963 |
111 ## - MAIN ENTRY--MEETING NAME |
Meeting name or jurisdiction name as entry element |
Berkelry International materials conference on electron microscopy and strenth of crystals |
Location of meeting |
Berkeley |
Date of meeting |
7/5/1961 |
245 ## - TITLE STATEMENT |
Title |
Electron microscopy and strength of crystal |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc. |
New York |
Name of publisher, distributor, etc. |
John Wiley |
Date of publication, distribution, etc. |
1963 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xi,1022p. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographies |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Crystals structure |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Thomas, Gareth |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Proceedings |