000 -LEADER |
fixed length control field |
00606nam a22001937a 4500 |
001 - CONTROL NUMBER |
control field |
34695 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
BD-DhUET |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
151013b xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0750303476 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
DLC |
Transcribing agency |
DLC |
Modifying agency |
BD-DhUET |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.11299 |
Item number |
INS/1995 |
111 ## - MAIN ENTRY--MEETING NAME |
Meeting name or jurisdiction name as entry element |
Institute of Physics |
Location of meeting |
Oxford University |
Date of meeting |
20/3/1995 |
245 ## - TITLE STATEMENT |
Title |
Microscopy and semiconducting materials |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc. |
Bristol |
Name of publisher, distributor, etc. |
Institute of Physics Publishing |
Date of publication, distribution, etc. |
1995 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xvii, 795p. |
Other physical details |
ill. |
Dimensions |
Paper Binding ( 35 cm.) |
490 ## - SERIES STATEMENT |
Series statement |
Institute of Physics conference series, no. 146 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Proceedings |