000 -LEADER |
fixed length control field |
00556nam a2200205 a 4500 |
001 - CONTROL NUMBER |
control field |
40398 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
BD-DhUET |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
050222s2003 njua b 001 0 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
1860943608 |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
DLC |
Transcribing agency |
DLC |
Modifying agency |
BD-DhUET |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
539.7222 |
Item number |
FEW/2003 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Fewster, Paul F. |
245 10 - TITLE STATEMENT |
Title |
X-ray scattering from semiconductors |
250 ## - EDITION STATEMENT |
Edition statement |
2nd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc. |
River Edge, NJ |
Name of publisher, distributor, etc. |
Imperial College Press |
Date of publication, distribution, etc. |
2003 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xiv, 299 p. |
Other physical details |
ill. |
Dimensions |
24 cm. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographies |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
X-rays- Scattering |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
General Book |