Scanning electron microscopy: physics of image formation and microanalysis /
by Reimer, Ludwig.
Publisher: Berlin: Springer, 1998Edition: 2nd com. rev.Description: xiv,527p. : ill. ; 26 cm.ISBN: 3540135308.Subject(s): Scanning electron microscopyOnline resources: Click here to access online | Click here to access onlineItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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General Book | Central Library, BUET Circulation section | 502.82/REI/1998 (Browse shelf) | 1 | Available | 104963 | |
General Book | Central Library, BUET Circulation section | 502.82/REI/1998 (Browse shelf) | 2 | Available | 104964 |
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502.82/BIR/2003 Scanning probe microscopes : | 502.82/EAT/2010 Atomic force microscopy / | 502.82/EAT/2010 Atomic force microscopy / | 502.82/REI/1998 Scanning electron microscopy: | 502.82/REI/1998 Scanning electron microscopy: | 502.82/VOG/2012 Modeling nanoscale imaging in electron microscopy / | 502/LAN/1972 Handbook of basic science |
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