Modeling nanoscale imaging in electron microscopy /
by Vogt, Thomas; Vogt, Thomas; Dahmen, Wolfgang; Binev, Peter.
Series: Nanostructure science and technology.Publisher: New York : Springer, 2012Description: ix,182p.ISBN: 9781461421900.Subject(s): Scanning electron microscopesOnline resources: Click here to access online | Click here to access online | Click here to access online| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Edited Book | Central Library, BUET Circulation section | 502.82/VOG/2012 (Browse shelf) | 1 | Available | 112890 |
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| 502.82/EAT/2010 Atomic force microscopy / | 502.82/REI/1998 Scanning electron microscopy: | 502.82/REI/1998 Scanning electron microscopy: | 502.82/VOG/2012 Modeling nanoscale imaging in electron microscopy / | 502/LAN/1972 Handbook of basic science | 502.8/DOM/1980 Research methods | 502.8/LAU/1981 Science and hypothesis |
Includes bibliographies.
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