Characterization methods for submicron MOSFETs
by Haddara, Hisham.
Series: Publisher: Boston Kluwer Academic Publishers 1995Edition: 1st ed.Description: vii, 232p. ill.ISBN: 0792396952 .Subject(s): Metal oxide semiconductor field - Effect transistors| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Edited Book | Central Library, BUET Reading section | 623.9732/HAD/1995 (Browse shelf) | 1 | Available | 93109 | |
| Reading Item | Central Library, BUET Reading section | 623.9732/HAD/1995 (Browse shelf) | 2 | Available | 93110 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
|
|
|
|
|
|
|
||
| 623.96/ULA/2001 Fundamentals of applied electromagnetics | 623.9732/GRA/1994 Wave pipelining | 623.9732/HAD/1995 Characterization methods for submicron MOSFETs | 623.9732/HAD/1995 Characterization methods for submicron MOSFETs | 623.9732/JHA/1990 Testing and reliable design of CMOS circuits | 623.9732/MIC/1993 BiCMOS technology and applications | 623.9732/RAM/1997 Thin film ferroelectric materials and devices |
Includes bibliographies
There are no comments for this item.