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Neural models and algorithms for digital testing

by Chakradhar, Srimat T; Agrawal, Vishwani D; Bushnell, Michael L.
Series: Publisher: Boston Kluwer Academic Publishers 1991Edition: 1st ed.Description: xii, 184 p. ill. 25 cm.ISBN: 0792391659 .Subject(s): Logic circuits
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Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Reading section
623.95/CHA/1991 (Browse shelf) 1 Available 90599

Includes bibliographies

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