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IDDQ testing of VLSI circuits

by Gulati, Ravi K; Hawkins, Charles F.
Publisher: Boston Kluwer Academic Publishers 1993Edition: 1st ed.Description: 120 p. ill.ISBN: 0792393155.Subject(s): Integrated circuits - Very large scale integration - Testing
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Item type Current location Call number Copy number Status Date due Barcode
Reading Item Central Library, BUET
Reading section 		623.95/GUL/1993 (Browse shelf) 1 Available 90604

Includes bibliographies

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