Hot-carrier reliability of MOS VLSI circuits
by Leblebici, Yusuf; Kang, Sung-Mo.
Series: Publisher: London Kluwer Academic 1993Edition: 1st ed.Description: xvi, 212p. ill.ISBN: 079239352X.Subject(s): Integrated circuits - VLSIItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Reading Item | Central Library, BUET Reading section | 623.95/LEB/1993 (Browse shelf) | 1 | Available | 90607 |
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623.95/GUL/1993 IDDQ testing of VLSI circuits | 623.95/KAN/2003 CMOS digital integrated circuits | 623.95/KUO/1998 CMOS VLSI engineering | 623.95/LEB/1993 Hot-carrier reliability of MOS VLSI circuits | 623.95/LOE/1986 DC flux parametron | 623.95/MAL/1986 Digital principles and applications | 623.95/MAR/2005 Introduction to logic design |
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