Analog and mixed-signal boundary-scan a guide to the IEEE 1149.4 test standard
by Osseiran, Adam.
Series: Frontiers in electronic testing.Publisher: Boston Kluwer Academic Publishers 1999Edition: 1st ed.Description: xviii, 155 p. ill. 24 cm.ISBN: 0792386868.Subject(s): Signal processing| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Reading Item | Central Library, BUET Reading section | 623.8043/OSS/1999 (Browse shelf) | 1 | Available | 95103 |
Includes bibliographies
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