Characterization methods for submicron MOSFETs
by Haddara, Hisham.
Series: Publisher: Boston : Kluwer Academic Publishers, 1995Edition: Ist ed.Description: vii, 232 p. : ill. ; 24 cm.ISBN: 0792396952.Subject(s): Metal oxide semiconductor field-effect transistorsOnline resources: Click here to access online | Click here to access onlineItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Edited Book | Central Library, BUET Circulation section | 623.9732/HAD/1995 (Browse shelf) | 1 | Available | 93111 |
Browsing Central Library, BUET Shelves , Shelving location: Circulation section Close shelf browser
623.96/HAB/2008 Bioeffects and therapeutic applications of electromagnetic energy | 623.96/HAB/2008 Bioeffects and therapeutic applications of electromagnetic energy | 623.9732/BAL/2011 Advanced high voltage power device concepts / | 623.9732/HAD/1995 Characterization methods for submicron MOSFETs | 623.9732/JHA/1990 Testing and reliable design of CMOS circuits | 623.9732/MIC/1993 BiCMOS technology and applications | 623.9732/RAM/1997 Thin film ferroelectric materials and devices |
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