Characterization of nanostructures
by Myhra, Sverre; Rivière, John C.
Publisher: Boca Raton Taylor & Francis 2013Edition: 1st ed.Description: xix,314p.ISBN: 9781439854150 .Subject(s): Nanostructured Materials| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Circulation section | 620.5/MYH/2013 (Browse shelf) | 1 | Available | 113570 |
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| 620.5/MAM/2017 Tunnel field-effect transistors (TFET) | 620.5/MAM/2017 Tunnel field-effect transistors (TFET) | 620.5/MAN/2017 Metrology and standardization of nanotechnology | 620.5/MYH/2013 Characterization of nanostructures | 620.5/NOG/2012 Tutorials in metamaterials | 620.5/OCO/2006 Carbon nanotubes | 620.5/PAL/2022 Sensors for stretchable electronics in nanotechnology |
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