Circuit, device, and process simulation mathematical and numerical aspects
by Carey, G. F; Richardson, W. B; Reed, C. S; Mulvaney, B.
Publisher: New York John Wiley & Sons 1996Edition: 1st ed.Description: xiii, 425p. ill.ISBN: 0471960195 .Subject(s): Electronic circuit design| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Circulation section | 623.815/CAR/1996 (Browse shelf) | 1 | Available | 92938 | |
| General Book | Central Library, BUET Circulation section | 623.815 /CAR/1996 (Browse shelf) | 2 | Available | 92937 | |
| Reading Item | Central Library, BUET Reading section | 623.815/CAR/1996 (Browse shelf) | 3 | Available | 92939 | |
| Reading Item | Central Library, BUET Reading section | 623.815/CAR/1996 (Browse shelf) | 4 | Available | 92940 |
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| 623.815/BOY/1982 Electronic devices and circuit theory | 623.815/BRO/1990 Practical switching power supply design | 623.815/CAR/1996 Circuit, device, and process simulation | 623.815/CAR/1996 Circuit, device, and process simulation | 623.815/CHA/1985 Molecular beam epitaxy and heterostructures | 623.815/CHA/2002 Fault-Tolerance and reliability techniques for high-density random-access memories | 623.815/CHA/2002 Fault-Tolerance and reliability techniques for high-density random-access memories |
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