Testing and reliable design of CMOS circuits
by Jha, Niraj K; Kundu, Sandip.
Series: The Kluwer international series in engineering and computer science.Publisher: Boston Kluwer Academic Publishers 1990Edition: 1st ed.Description: xii, 231p. ill.ISBN: 0792390563.Subject(s): Metal Oxide| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Circulation section | 623.9732 /990/JHA (Browse shelf) | 1 | Available | 90894 | |
| General Book | Central Library, BUET Circulation section | 623.9732/JHA/1990 (Browse shelf) | 2 | Available | 90895 | |
| Reading Item | Central Library, BUET Reading section | 623.9732/JHA/1990 (Browse shelf) | 3 | Available | 90606 |
Includes bibliographies
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