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Testing and reliable design of CMOS circuits

by Jha, Niraj K; Kundu, Sandip.
Series: The Kluwer international series in engineering and computer science.Publisher: Boston Kluwer Academic Publishers 1990Edition: 1st ed.Description: xii, 231p. ill.ISBN: 0792390563.Subject(s): Metal Oxide
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Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Circulation section
623.9732 /990/JHA (Browse shelf) 1 Available 90894
General Book Central Library, BUET
Circulation section
623.9732/JHA/1990 (Browse shelf) 2 Available 90895
Reading Item Central Library, BUET
Reading section
623.9732/JHA/1990 (Browse shelf) 3 Available 90606

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