Fundamentals of powder diffraction and structural characterization of materials
by Pecharsky, Vitalij K; Zavalij, Peter Y.
Publisher: New York Springer Science+Business Media 2009Edition: 2nd ed.Description: xxiii, 741 p.ISBN: 9780387095783.Subject(s): X-ray crystallography| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Reading section | 548.83/PEC/2009 (Browse shelf) | 1 | Available | 115213 |
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| 548.83/BOW/1998 High resolution X-ray diffractometry and topography | 548.83/DAV/2002 Structure determination from powder diffraction data | 548.83/JEN/1996 Introduction to X-ray powder diffractometry | 548.83/PEC/2009 Fundamentals of powder diffraction and structural characterization of materials | 548.83/SNY/1999 Defect and microstructure analysis by diffraction | 548.83/YOU/1993 Rietveld method | 548.84/KOC/1998 Texture and anisotropy |
Includes bibliographies
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