Thin film analysis by X-ray scattering
by Birkholz, Mario.
Publisher: Weinheim Wiley-VCH Verlag 2006Edition: 1st ed.Description: xxii, 356 p.ISBN: 9783527310524.Subject(s): Thin films | X-ray spectroscopy| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Reading section | 623.8152/BIR/2006 (Browse shelf) | 1 | Available | 115719 |
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| 623.8152/BAC/1997 Thin films on glass | 623.8152/BAC/1997 Thin films on glass | 623.8152/BAL/2012 Semiconductors | 623.8152/BIR/2006 Thin film analysis by X-ray scattering | 623.8152/BUB/1992 Photoelectronic properties of semiconductors | 623.8152/CAM/2001 Science and engineering of microelectronic fabrication | 623.8152/COL/1997 Silicon-on-insulator technology |
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