Introduction to X-ray powder diffractometry
by Jenkins, Ron; Snyder, Robert L.
Series: Chemical analysis ; Volume 138.Publisher: New York John Wiley & Sons 1996Edition: 1st ed.Description: xxiii, 403 p.ISBN: 9780471513391.Subject(s): X-rays- Diffraction- TechniqueItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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General Book | Central Library, BUET Reading section | 548.83/JEN/1996 (Browse shelf) | 1 | Available | 115716 |
Browsing Central Library, BUET Shelves , Shelving location: Reading section Close shelf browser
548.83/BLA/2009 Crystal structure analysis | 548.83/BOW/1998 High resolution X-ray diffractometry and topography | 548.83/DAV/2002 Structure determination from powder diffraction data | 548.83/JEN/1996 Introduction to X-ray powder diffractometry | 548.83/PEC/2009 Fundamentals of powder diffraction and structural characterization of materials | 548.83/SNY/1999 Defect and microstructure analysis by diffraction | 548.83/YOU/1993 Rietveld method |
Includes bibliographies
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