Metrology and standardization of nanotechnology protocols and industrial Innovations
by Mansfield, Elisabeth; Kaiser, Debra L; Fujita, Daisuke; Voode, Marcel Van de.
Series: Nanotechnology innovation and applications.Publisher: Weinheim WILEY-VCH Verlag GmbH 2017Edition: 1st ed.ISBN: 9783527340392.Subject(s): Nanotechnology| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| General Book | Central Library, BUET Circulation section | 620.5/MAN/2017 (Browse shelf) | 1 | Available | 117914 |
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| 620.5 /LIS/2018 Introduction to micromechanics and nanomechanics | 620.5/MAM/2017 Tunnel field-effect transistors (TFET) | 620.5/MAM/2017 Tunnel field-effect transistors (TFET) | 620.5/MAN/2017 Metrology and standardization of nanotechnology | 620.5/MYH/2013 Characterization of nanostructures | 620.5/NOG/2012 Tutorials in metamaterials | 620.5/OCO/2006 Carbon nanotubes |
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