Atomic and nuclear analytical methods XRF, Mossbauer, XPS, NAA and ion-beam spectroscopic techniques
by Verma, H. R.
Publisher: Berlin Springer-Verlag 2007Edition: 1st ed.Description: xiv, 375 p.ISBN: 9783540302773 .Subject(s): Particles - Nuclear physicsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Book | Central Library, BUET Circulation section | 539.72/VER/2007 (Browse shelf) | 1 | Available | 119536 |
Browsing Central Library, BUET Shelves , Shelving location: Circulation section Close shelf browser
No cover image available No cover image available | No cover image available No cover image available | No cover image available No cover image available | No cover image available No cover image available | No cover image available No cover image available | ||||
539.72/ROS/1961 High-Energy particles | 539.72/ROS/1961 High-Energy particles | 539.72/THO/1969 Defects and radiation damage in metals | 539.72/VER/2007 Atomic and nuclear analytical methods | 539.721/ADV/1968 Advances in particles physics | 539.721/AND/1981 AIP 50th anniversary physics vade mecum | 539.721/BAR/1967 Theory of the scattering matrix |
Includes bibliographies
There are no comments for this item.