Koha online

Your cart is empty.
Normal view MARC view ISBD view

Reliability of electronic packages and semiconductor devices

by Giacomo, Giulio di.
Series: Electronic Packaging and Interconnection Series.Publisher: New York McGraw-Hill 1997Edition: 1st ed.Description: xiv, 410 p. ill. 24 cm.ISBN: 007017024X .Subject(s): Reliability (Semiconductor)Online resources: Click here to access online | Click here to access online
Tags from this library: No tags from this library for this title. Add tag(s)
Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Circulation section 		623.815/GIA/1997 (Browse shelf) 1 Available 93798

Includes bibliographies

There are no comments for this item.

Log in to your account to post a comment.