Recombination lifetime measurements in silicon
by Workshop on silicon recombination lifetime characterization methods Santa Clara 06/02/1997; Gupta, Dinesh C; Sponsord by SEMI and ASTM Committee F1.
Series: ASTM special technical publication;1340.Publisher: West Conshohocken ASTM 1998Description: 392 p. ill. 24 cm.ISBN: 0803124899.Subject(s): Semiconductors| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 1 | Available | 99227 | |
| Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 2 | Available | 99388 | |
| Proceedings | Central Library, BUET Circulation section | 623.815/WOR/1998 (Browse shelf) | 3 | Available | 99389 | |
| Proceedings | Central Library, BUET Reference section | 623.815/WOR/1998 (Browse shelf) | 4 | Available | 99226 |
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