TY - BOOK AU - Gulati, Ravi K. AU - Hawkins, Charles F. TI - IDDQ testing of VLSI circuits SN - 0792393155 U1 - 623.95 PY - 1993/// CY - Boston PB - Kluwer Academic Publishers KW - Integrated circuits - Very large scale integration - Testing N1 - Includes bibliographies ER -