Search for '(su:{Integrated circuits-Very large scale integration })'

Essentials of electronic testing for digital memory, and mixed-signal VLSI circuits

By Bushnell, Michael L.. Boston Kluwer Academic, 2000 . xviii, 690 p. 26 cm.. 0792379918

By Balkır, Sina.. Boca Raton: CRC Press, 2003 . 218 p. : 24 cm.. 0849310903

By Attia, John Okyere.. Boca Raton : CRC Press, 2002 . 338 p. : 25 cm.. 0849312639

By Sherwani, Naveed A.. Boston : Kluwer Academic Publishers, 1999 . xxx, 572 p. : 24 cm.. 0792383931

By Roy, Kaushik.. New York : Wiley, 2000 . xv, 359 p. : , "A Wiley-Interscience publication." 25 cm.. 047111488X

By Sapatnekar, Sachin S.,. Boston : Kluwer Academic Publishers, 1993 . xx, 269 p. : 25 cm.. 0792392817 | 9780792392811

By Geiger, Randall L.. New York McGraw-Hill 1990 . xv, 969p. 0070232539

By Itoh, Kiyoo. New York Springer Verlag 2001 . xi,495p. 3540678204

By Chen, Wai-Kai. London CRC Press 2003 . Various paging 084931738X

By Gulati, Ravi K.. Boston Kluwer Academic Publishers 1993 . 120 p. 0792393155

New York, NY : Institute of Electrical and Electronics Engineers, 1993 . v. : , Title from cover. 28 cm..

New York, NY : Institute of Electrical and Electronics Engineers, 1993 . v. : , Title from cover. 28 cm..

By Wali Mohammad Abdullah . Dhaka Institute of Information and Communication Technology 2014 . x,86p.

By Brunvand, Erik. Boston Addison Wesley 2010 . xvi, 571 p. 9780321547996

By Harun-ur Rashid, ABM. Dhaka Department of Electrical and Electronic Engineering, BUET . 268p.