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Results of search for 'au:"Allison, John"'

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	1.	Small-crack test methods by Larsen, James M; Allison, John E. -- Symposium on small-Crack test methods Philadelphia 11/14/1990; Organised by J. M. Larsen; Sponsored by ASTM E-9. Publisher: Philadelphia ASTM 1992Availability: Items available for loan: Central Library, BUET [620.1126/SYM/1992] (4). Place hold Add to cart (remove)
	2.	Small-Crack test methods by Larsen, James M; Allison, John E. -- Symposium on small-Crack test methods San Antonio 11/14/1990; Organized by Larsen, J. M.; Sponsord by ASTM. Publisher: Philadelphia ASTM 1992Availability: Items available for loan: Central Library, BUET [620.1126/SYM/1992] (3). Place hold Add to cart (remove)
	3.	Electronic engineering semiconductors and devices by Allison, John. Edition: 2nd ed.Publisher: London McGraw-Hill 1990Availability: Items available for loan: Central Library, BUET [623.81/ALL/1990] (1). Place hold Add to cart (remove)
	4.	Legal environment of business by Howell, Rate A; Allison, John R; Henley, N. T. Edition: 1st ed.Publisher: Chicago Dryden Press 1984Availability: Items available for loan: Central Library, BUET [346.73/HOW/1984] (1). Place hold Add to cart (remove)
	5.	Electronic integrated circuits their technology and design by Allison, John. Edition: 1st ed. Publisher: London McGraw-Hill 1975Availability: Items available for loan: Central Library, BUET [623.815/ALL/1975] (1). Place hold Add to cart (remove)
	6.	Electronic engineering materials and devices by Allison, John. Edition: 1st ed. Publisher: Bombay Tata McGraw-Hill 1971Availability: Items available for loan: Central Library, BUET [623.81/ALL/1971] (2). Place hold Add to cart (remove)
	7.	Electronic engineering semiconductors and devices by Allison, John. Edition: 2nd ed.Publisher: New York McGraw-Hill 1990Availability: Items available for loan: Central Library, BUET [623.81/ALL/1990] (1). Place hold Add to cart (remove)