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1.
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Silicon VLSI technology : fundamentals, practice, and modeling
by Plummer, James D;
Deal, Michael D;
Griffin, Peter B.
Edition: 1st ed.Publisher: New Delhi: Dorling Kindersley, 2000Availability: No items available Checked out (2).
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2.
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VLSI Test principles and architectures: design for testability
by Wang, Laung-Terng;
Wen Wu, Cheng;
Wen, Xiaoqing.
Edition: 1st ed.Publisher: New Delhi: Elsevier India, 2006Availability: Items available for loan: Central Library, BUET [623.8173/WAN/2006] (1).
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3.
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Analysis and design of digital integrated circuits : in deep submicron technology
by Hodges, David A;
Jackson, Horace G;
Saleh, Resve A.
Edition: 3rd ed.Publisher: Boston : McGraw-Hill Higher Education, 2004Online Access: Click here to access online | Click here to access online Availability: Items available for loan: Central Library, BUET [623.8173/ HOD/2004] (1).
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4.
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VLSI Testing digital and mixed analogue/ digital techniques
by Hurst, Stanley L.
Edition: 1st ed.Publisher: Stevenage Institution of Electrical Engineers 1998Availability: Items available for loan: Central Library, BUET [623.8173/HUR/1998] (2).
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5.
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Principles of CMOS VLSI design a systems perspective
by Weste, Neil H. E;
Eshraghian, Kamran.
Edition: 2nd ed.Publisher: New York Addison-Wesley Publishing 1993Availability: Items available for loan: Central Library, BUET [623.8173/WES/1993] (9).
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6.
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Contemporary logic design
by Katz, Randy H.
Edition: Ist ed.Publisher: Redwood City, Calif. : Benjamin/Cummings, 1994Availability: Items available for loan: Central Library, BUET [623.8173/KAT/1994] (1).
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7.
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Modeling and simulation of high speed VLSI interconnects
by Nakhla, M. S;
Zhang, Q. J.
Edition: Ist ed.Publisher: Boston: Kluwer Academic Publishers, 1994Availability: Items available for loan: Central Library, BUET [623.8173/NAK/1994] (1).
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8.
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Introduction to microelectronic fabrication
by Jaeger, Richard C.
Publisher: Massachusetts Addison-Wesley 1988Availability: Items available for loan: Central Library, BUET [623.8173/JAE/1988] (1).
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9.
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Introduction to VLSI design
by Fabricius, Eugene D.
Edition: 1st ed.Publisher: New York McGraw-Hill 1990Availability: Items available for loan: Central Library, BUET [623.8173/FAB/1990] (1).
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10.
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Hot-carrier reliability of MOS VLSI circuits
by Leblebici, Yusuf;
Kang, Sung-Mo.
Edition: 1st ed.Publisher: London Kluwer Academic 1993Availability: Items available for loan: Central Library, BUET [623.95/LEB/1993] (1).
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