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1.
Defect and microstructure analysis by diffraction

by Snyder, Robert L; Fiala, Jaroslav; Bunge, Hans J.

Edition: 1st ed.Publisher: Oxford Oxford University Press 1999Availability: Items available for loan: Central Library, BUET [548.83/SNY/1999] (1).

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2.
Introduction to X-ray powder diffractometry

by Jenkins, Ron; Snyder, Robert L.

Edition: 1st ed.Publisher: New York John Wiley & Sons 1996Availability: Items available for loan: Central Library, BUET [548.83/JEN/1996] (1).

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