IDDQ testing of VLSI circuits
by Gulati, Ravi K; Hawkins, Charles F.
Publisher: Boston Kluwer Academic Publishers 1993Edition: 1st ed.Description: 120 p. ill.ISBN: 0792393155.Subject(s): Integrated circuits - Very large scale integration - TestingItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Reading Item | Central Library, BUET Reading section | 623.95/GUL/1993 (Browse shelf) | 1 | Available | 90604 |
Includes bibliographies
There are no comments for this item.