Essentials of electronic testing for digital memory, and mixed-signal VLSI circuits
by Bushnell, Michael L; Agrawal, Vishwani D.
Publisher: Boston Kluwer Academic, 2000Edition: Ist ed.Description: xviii, 690 p. ill. ; 26 cm.ISBN: 0792379918 .Subject(s): Integrated circuits-Very large scale integrationOnline resources: Click here to access onlineItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
General Book | Central Library, BUET Circulation section | 623.95/ BUS/2000 (Browse shelf) | 1 | Available | 103564 | |
General Book | Central Library, BUET Circulation section | 623.95/ BUS/2000 (Browse shelf) | 2 | Available | 103565 | |
General Book | Central Library, BUET Circulation section | 623.95/BUS/2000 (Browse shelf) | 3 | Available | 103566 |
Includes bibliographies.
There are no comments for this item.