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Essentials of electronic testing for digital memory, and mixed-signal VLSI circuits

by Bushnell, Michael L; Agrawal, Vishwani D.
Publisher: Boston Kluwer Academic, 2000Edition: Ist ed.Description: xviii, 690 p. ill. ; 26 cm.ISBN: 0792379918 .Subject(s): Integrated circuits-Very large scale integrationOnline resources: Click here to access online
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Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Circulation section
623.95/ BUS/2000 (Browse shelf) 1 Available 103564
General Book Central Library, BUET
Circulation section
623.95/ BUS/2000 (Browse shelf) 2 Available 103565
General Book Central Library, BUET
Circulation section
623.95/BUS/2000 (Browse shelf) 3 Available 103566

Includes bibliographies.

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