Characterization methods for submicron MOSFETs
by Haddara, Hisham.
Series: Publisher: Boston : Kluwer Academic Publishers, 1995Edition: Ist ed.Description: vii, 232 p. : ill. ; 24 cm.ISBN: 0792396952.Subject(s): Metal oxide semiconductor field-effect transistorsOnline resources: Click here to access online | Click here to access onlineItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Edited Book | Central Library, BUET Circulation section | 623.9732/HAD/1995 (Browse shelf) | 1 | Available | 93111 |
Includes bibliographies
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