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Characterization methods for submicron MOSFETs

by Haddara, Hisham.
Series: Publisher: Boston : Kluwer Academic Publishers, 1995Edition: Ist ed.Description: vii, 232 p. : ill. ; 24 cm.ISBN: 0792396952.Subject(s): Metal oxide semiconductor field-effect transistorsOnline resources: Click here to access online | Click here to access online
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Item type Current location Call number Copy number Status Date due Barcode
Edited Book Central Library, BUET
Circulation section 		623.9732/HAD/1995 (Browse shelf) 1 Available 93111

Includes bibliographies

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