Neural models and algorithms for digital testing
by Chakradhar, Srimat T; Agrawal, Vishwani D; Bushnell, Michael L.
Series: Publisher: Boston Kluwer Academic Publishers 1991Edition: 1st ed.Description: xii, 184 p. ill. 25 cm.ISBN: 0792391659 .Subject(s): Logic circuitsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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General Book | Central Library, BUET Reading section | 623.95/CHA/1991 (Browse shelf) | 1 | Available | 90599 |
Includes bibliographies
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