BUET online Catalog › Results of search for 'au:"Bushnell, Michael L." and location:CRS'

	1.	Essentials of electronic testing for digital memory, and mixed-signal VLSI circuits by Bushnell, Michael L; Agrawal, Vishwani D. Edition: Ist ed.Publisher: Boston Kluwer Academic, 2000Online Access: Click here to access online Availability: Items available for loan: Central Library, BUET [623.95/ BUS/2000] (3). Place hold Add to cart (remove)
	2.	Neural models and algorithms for digital testing by Chakradhar, Srimat T; Agrawal, Vishwani D; Bushnell, Michael L. Edition: Ist edPublisher: Boston : Kluwer Academic Publishers, 1991Availability: Items available for loan: Central Library, BUET [623.95/CHA/1991] (2). Place hold Add to cart (remove)

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