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VLSI Test principles and architectures: design for testability/

by Wang, Laung-Terng; Wen Wu, Cheng; Wen, Xiaoqing.
Publisher: New Delhi: Elsevier India, 2006Edition: 1st ed.Description: xxx,777p.ISBN: 9789380501550.Subject(s): Integrated circuits- VLSI-Design and construction
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Item type Current location Call number Copy number Status Date due Barcode
General Book Central Library, BUET
Circulation section 		623.8173/WAN/2006 (Browse shelf) 1 Available 111642

Includes bibliographies

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