<![CDATA[ Search for 'se,phr:"The Kluwer International series in engineering and computer science" and au:Bushnell, Michael L.']]>

<![CDATA[ Search for 'se,phr:"The Kluwer International series in engineering and computer science" and au:Bushnell, Michael L.']]> http://lib.buet.ac.bd/cgi-bin/koha/opac-search.pl?q=ccl=se%2Cphr%3A%22The%20Kluwer%20International%20series%20in%20engineering%20and%20computer%20science%22%20and%20au%3ABushnell%2C%20Michael%20L.&format=rss2 2 0 50 Neural models and algorithms for digital testing ISBN 0792391659 http://lib.buet.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=30545

By Chakradhar, Srimat T.. Boston Kluwer Academic Publishers 1991 . xii, 184 p. 25 cm.. 0792391659

Place Hold on Neural models and algorithms for digital testing

]]> http://lib.buet.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=30545 Neural models and algorithms for digital testing ISBN 0792391659 http://lib.buet.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=3589

By Chakradhar, Srimat T.. Boston : Kluwer Academic Publishers, 1991 . xii, 184 p. : 25 cm.. 0792391659

Place Hold on Neural models and algorithms for digital testing

]]> http://lib.buet.ac.bd/cgi-bin/koha/opac-detail.pl?biblionumber=3589