Neural models and algorithms for digital testing
by Chakradhar, Srimat T; Agrawal, Vishwani D; Bushnell, Michael L.
Series: Publisher: Boston : Kluwer Academic Publishers, 1991Edition: Ist ed.Description: xii, 184 p. : ill. ; 25 cm.ISBN: 0792391659.Subject(s): Logic circuitsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
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General Book | Central Library, BUET Circulation section | 623.95/CHA/1991 (Browse shelf) | 1 | Available | 90883 | |
General Book | Central Library, BUET Circulation section | 623.95/CHA/1991 (Browse shelf) | 2 | Available | 90884 |
Includes bibliographies
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