Characterization methods for submicron MOSFETs
by Haddara, Hisham.
Series: Publisher: Boston Kluwer Academic Publishers 1995Edition: 1st ed.Description: vii, 232p. ill.ISBN: 0792396952 .Subject(s): Metal oxide semiconductor field - Effect transistorsItem type | Current location | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|
Edited Book | Central Library, BUET Reading section | 623.9732/HAD/1995 (Browse shelf) | 1 | Available | 93109 | |
Reading Item | Central Library, BUET Reading section | 623.9732/HAD/1995 (Browse shelf) | 2 | Available | 93110 |
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