000 00607nam a2200217 a 4500
001 10102
003 BD-DhUET
008 811203s1982 nyua b 001 0 eng
020 _a0471864250
040 _aDLC
_cDLC
_dBD-DhUET
082 0 0 _a620.00452
_bMAR/1982
100 1 _aMartz, Harry F.
245 1 0 _aBayesian reliability analysis
250 _a1st. ed.
260 _aNew York
_b John Wiley & Sons
_c1982
300 _axix, 745 p.
_bill.
_c24 cm.
490 _aWiley series in probability and mathematical statics
650 0 _aReliability (Engineering)
700 1 _aWaller, Ray A.
942 _cGB
999 _c10102
_d10102