000 00536nam a2200217 a 4500
001 10251
003 BD-DhUET
008 890214s1988 nyuaf b 001 0 eng
020 _a0333525361
040 _c0
_dBD-DhUET
082 _a620.11
_bHUL/1980
100 _aHull, Barry
245 1 0 _aNon-Destructive testing
250 _a1st ed.
260 _aNew York
_bMacmillan Education
_c1980
300 _aviii, 144 p.
504 _aIncludes bibliographies
650 0 _aNondestructive testing
700 _aJohn, Vernon
942 _cGB
999 _c10251
_d10251