| 000 | 00783nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | 11076 | ||
| 003 | BD-DhUET | ||
| 008 | 890922s1990 nyua b s001 0 eng | ||
| 020 | _a0471511048 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a623.815 _bSEH/1990 |
| 100 | 1 | _aSchroder, Dieter K. | |
| 245 | 1 | 0 |
_aSemiconductor material and device characterization _cDieter K. Schroder. |
| 260 |
_aNew York _bJohn Wiley & Sons _c1990. |
||
| 300 |
_axv, 599 p. _bill. _c25 cm. |
||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aSemiconductors | |
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-b.html |
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-d.html |
| 856 | 4 | 1 | _uhttp://www.loc.gov/catdir/enhancements/fy0650/89024881-t.html |
| 942 | _cGB | ||
| 999 |
_c11076 _d11076 |
||