| 000 | 00499nam a2200193 a 4500 | ||
|---|---|---|---|
| 001 | 11264 | ||
| 003 | BD-DhUET | ||
| 008 | 851024s1986 nyua 000 0 eng | ||
| 020 | _a0070509972 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a623.81740287 _bPYN/1986 |
| 100 | _aPynn, Craig | ||
| 245 | 1 | 0 | _aStrategies for electronics test |
| 250 | _a1st ed. | ||
| 260 |
_aNew York _bMcGraw-Hill _c1986 |
||
| 300 |
_ax, 174 p. _bill. _c22 cm. |
||
| 650 | 0 | _aPrinting circuits-testing | |
| 942 | _cGB | ||
| 999 |
_c11264 _d11264 |
||