000 00604nam a2200217 a 4500
001 11319
003 BD-DhUET
008 830224s1983 nyua b 001 0 eng
020 _a0471092517
040 _aDLC
_cDLC
_dBD-DhUET
082 _a623.8173
_bMAR/1983
100 1 _aMarcus, R. B.
245 1 0 _aTransmission electron microscopy of silicon VLSI circuits and structures
250 _a1st ed.
260 _aNew York
_bJohn Wiley & Sons
_c1983
300 _ax, 217p.
_bill.
_c29 cm.
504 _aIncludes bibliographies
650 0 _aIntegrated circuits
700 1 _aSheng, T. T.
942 _cGB
999 _c11319
_d11319