| 000 | 00886nam a22002657a 4500 | ||
|---|---|---|---|
| 001 | 1268 | ||
| 003 | BD-DhUET | ||
| 008 | 071005s2008 enk b 001 0 eng | ||
| 020 | _a9780470027851 | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a620.11299 _bBRA/2008 |
| 100 | 1 | _aBrandon, D. G. | |
| 245 | 1 | 0 |
_aMicrostructural characterization of materials _cDavid Brandon and Wayne Kaplan. |
| 250 | _a2nd ed. | ||
| 260 |
_aChichester, England : _bJohn Wiley & Sons, _c2008. |
||
| 300 |
_axii, 536 p. : _bill. (some col.) ; _c25 cm. |
||
| 490 | 0 | _aQuantitative software engineering series | |
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aMaterials | |
| 650 | 0 | _aMicrostructure. | |
| 700 | 1 | _aKaplan, Wayne D. | |
| 856 | 4 | 2 | _uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-d.html |
| 856 | 4 | 1 | _uhttp://www.loc.gov/catdir/enhancements/fy0827/2007041704-t.html |
| 942 | _cGB | ||
| 999 |
_c1268 _d1268 |
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