| 000 | 00647nam a22002051 4500 | ||
|---|---|---|---|
| 001 | 18938 | ||
| 003 | BD-DhUET | ||
| 008 | 840419m00001962njua b 100 0 eng | ||
| 040 |
_aDLC/ICU _cICU _dBD-DhUET |
||
| 082 |
_a623.815 _bALV/1962 |
||
| 100 | _aAlven, William H. Von | ||
| 245 | 0 | 0 | _aSemiconductor reliability |
| 250 | _a12st ed. | ||
| 260 |
_aNew Jersey _bEngineering Publishers _c1962 |
||
| 300 |
_axvi, 400 p. _bill. _c24 cm. |
||
| 500 | _aVol. 2, Based on the Conference on Reliability Assurance Techniques for Semiconductor Specifications, October 1961 | ||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aSemiconductors | |
| 942 | _cEB | ||
| 999 |
_c18938 _d18938 |
||