| 000 | 00489nam a22001931 4500 | ||
|---|---|---|---|
| 001 | 19266 | ||
| 003 | BD-DhUET | ||
| 008 | 731212s1966 nyua b 000 0 eng | ||
| 040 |
_aDLC _cDLC _dBD-DhUET |
||
| 082 | 0 | 0 |
_a623.81072 _bFAR/1966 |
| 100 | _aFarkas, L. L. | ||
| 245 | 1 | 0 | _aElectronic testing |
| 250 | _a1st ed. | ||
| 260 |
_aNew York _bMcGraw-Hill _c1966 |
||
| 300 |
_axi, 304 p. _billus. |
||
| 504 | _aIncludes bibliographies | ||
| 650 | 0 | _aElectronics : Engineering | |
| 942 | _cEB | ||
| 999 |
_c19266 _d19266 |
||