000 00545nam a22002171 4500
001 24625
003 BD-DhUET
008 711115s1965 nyua b 000 0 eng
040 _aDLC
_cOAU
_dBD-DhUET
082 _a658
_bSHA/1965
100 _aShaffer, L. R.
245 1 4 _aCritical-path method
250 _a1st ed.
260 _aNew York
_bMcGraw-Hill
_c1965
300 _axi, 216 p.
_bill.
_c29 cm.
504 _aIncludes bibliographies
650 0 _aManagement : Business
700 _aRitter, J. B.
700 _aMeyer, W. L.
942 _cGB
999 _c24625
_d24625