000 00703nam a2200265 a 4500
001 29041
003 BD-DhUET
008 930512s2010 maua b 001 0 eng
020 _a9781606501115
020 _a1606501119
020 _a9781606501092
020 _a1606501097
040 _aDLC
_cDLC
_dBD-DhUET
082 0 0 _a620.1
_bSTR/2010
100 _aStrausser, Yale
245 0 0 _aCharacterization in silicon processing
250 _a1st ed.
260 _aNew York
_bMomentum Press
_c2010
300 _axiii, 240 p.
_bill.
_c25 cm.
490 _aMaterials characterization series
504 _aIncludes bibliographies
650 0 _aSilicon
650 0 _aElectric conductors
942 _cEB
999 _c29041
_d29041